| PART |
Description |
Maker |
| GET-30497 |
Qualification Test Results
|
CEL
|
| GET-BC-0006 |
Qualification Test Results on Si MMIC
|
CEL[California Eastern Labs]
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Labs
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Laboratories
|
| STQ1016Z STQ3016Z STQ-1016Z STQ-3016Z |
(STQ-x016Z) Reliability Qualification Report
|
ETC
|
| IRFB16N50K SIHFB16N50K SIHFB16N50K-E3 IRFB16N50KPB |
Low Gate Charge Qg Results in Simple Drive Requirement
|
Kersemi Electronic Co., Ltd.
|
| EFM32ZG222F4-QFP48 |
Updated specifications based on the results of additional silicon characterization.
|
Silicon Laboratories
|
| TS87C51RD2 TS83C51RD2 |
Qualification Package TS87C51RD2 / TS83C51RD2 CMOS 0.5Um
|
ATMEL[ATMEL Corporation]
|
| 6245-48-0 6245-48-2 |
Test Clip to Straight Sheathed Banana Plug
Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
|
Pomona Electronics
|
| AT17LV65 |
65/128/256/512K-bit and 1/2/4M-bit FPGA Configurator EEPROM (3.3V and 5V). Obtain the qualification
|
Atmel Corp
|
| C4000-VOIP C4000-IPTV C4000-VOIP-UNISTIM C4000-VOI |
T-BERD㈢/MTS-4000Multiple Services Test Platform
T-BERD?/MTS-4000Multiple Services Test Platform
T-BERD垄莽/MTS-4000Multiple Services Test Platform
|
JDS Uniphase Corporation
|
